Foundations in Electron Microscopy (EM) and Its Related Spectroscopies

The course is a general introduction to both physical principles and applications of the only technique capable of providing both imaging and compositional characterization with the best resolution currently available: electron microscopy (EM). Electron microscopy is based on common physical principles, which will be illustrated in the course, but can be performed in diverse operational modes: scanning (SEM), transmission (TEM), high resolution transmission (HRTEM) and scanning transmission (STEM). The physical principles, as well as aims, advantages and limits of each EM operational mode will be presented. Furthermore, since electron microscopy is based on the interaction between an electron beam and an object whose shape, size, possible crystalline structure and composition, the latter also spatially resolved, have to be investigated, the spectroscopies exploiting the signals originated by that interaction will be introduced. It will be then explained how they are capable to also provide the researchers with qualitative and quantitative information about chemical composition of the imaged samples: it's the so-called Analytical EM (AEM).
Thus, the main goal of the course is to provide its attendees with a broad overview of the modes in which electron microscopy is carried out, concomitantly underlining why it has been subjected of a never-ending development and improvement, being EM able to reveal insights on morphological, structural and compositional details of the investigated samples with spatial resolution that no other analysis technique is capable to reach.

At the end of the course, a student who attended it is expected:

1. to know the origin, development and physical principles on which electron microscopy is based;

2. to understand the aims and effectiveness of the different operational modes in electron microscopy, as well as the related limitations and how these can be addressed;

3. to get the chance, through experimental sessions, to observe both structure and way to operate a SEM and a TEM, and to observe by the diverse EM instruments some samples prepared for this purpose. Furthermore, the main aim of the practical sessions is to show why it's needed knowing the physics behind EM instruments in order to bring them into optimal working conditions (alignment procedures).

Finally, a short seminar (see below) is expected as a mandatory part of the final exam made by each student. In such a seminar, the student will have to both show and discuss a topic strongly related with the course content, and its possible applications. As well, the seminar aims to train a student to both briefly illustrate a topic of his/her choice clearly, rigorously and concisely, and to answer some questions that could be raised on it.